Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

e-Book & Magazine. July 31, 2010 by d3pz4i.
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
Kluwer | 2000 | ISBN: 0792379918, 0306470403 | 712 pages | PDF | 31,9 MB

Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means `meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.

The book consists of:

Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling;

Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test;

Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing;

Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries.

Download Hotfile.com
Hotfile
Download Depositifiles.com
Depositfiles



Download File

Here you can download files online. Unlimited access to all sources file with one click direct download link!
Share

Comment